1878-CC VAM-20
Error
Description
1878-CC VAM-20 Line in Eye, Medium CC with Dot, Denticle Impressions TA Discovered by Kirk Duncan, May 1977. Revised 2010. 20 (revised) II1 - B1g (Line in Eye, Medium CC with Dot, Denticle Impressions TA) Obverse II1 - Line in eye variety, (same as 1878-CC VAM-17) Reverse B1g - Medium spaced II CC mint marks at medium height. Long nock. Die chip in center of left C. Raised dots of denticle impression between lower serifs of TA in STATES w/ 2 faint raised dots between middle of TA & at top of lower serif of A. Spacing between them match denticle spacing. Heavy vertical die polishing lines in fields extending from points of letters & design elements. DPIS – In 1878 dates were part of the master die so there is no variation in position. ;Emission Sequence :Obverse: 20, 17 :Reverse: 20, 29 Comments: # LVA stated in the letter that the polishing lines are an (EDS) tell as well as the absence of a die crack by the denticle impression of TA. # Same obverse used for 1878-CC VAM 17. # [[1878-CC VAM-20 TDITD
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