1925-S Typical Die Clash TDC-1C-1925S-01

Description

This 1925-S Lincoln Wheat Cent underwent a die clash event that left visible design transfer on both sides. The obverse clash marks show a partial C from the word CENT and an almost full T from the same word, transferred from the reverse die during the clash. The reverse die shows progressive indirect design transfer indicating a slight offset in the positioning of the dies at the time of the clash event. Die clashes on 1920s San Francisco Mint Lincoln Cents are notable because the lower mintages at that facility compared to Philadelphia mean fewer die pairs were used, making individual die events relatively more identifiable. The coin and images were provided by Jean Lee. Collectors should examine the obverse field area near the bust truncation where the CENT letters would align during a clash, as the partial C and near-complete T provide strong visual confirmation of this variety.

External References