1993D-1DER-021T Trail Die Reverse

Description

Jeremy Gardner's third entry in the census presents die markers worth examining individually. On the obverse, a curved die scratch near the rim just below the date is significant — most die scratches are straight or gently arcing lines from abrasive particles dragged across the die face during polishing. A distinctly curved scratch suggests the particle followed a rotating motion or was made by a curved tool, making it a memorable diagnostic feature. On the reverse, a die crack runs through UNUM to the last period of E PLURIBUS UNUM, using the terminal punctuation as a positional endpoint, and a die gouge sits to the left of the O in ONE. The T suffix indicates tilted trail lines — the die's lateral shift produced directional streaks from raised design elements rather than wavy step distortion. At Stage C late die state, the crack through UNUM is consistent with advanced service. Struck at Denver on copper-plated zinc planchets, 2.5 grams, 19mm, plain edge.

Die Markers

• Stage “C”, obverse is LDS – curved die scratch next to the rim just below the date.
• Reverse is LDS – die crack in the word UNUM to the last period. Die gouge to the left of the O in ONE.

Attribution History

• Discovered by Jeremy Gardner
• Expert attribution by Trail Dies

External References