1970-S Repunched Mintmark RPM-009

Description

Documented by VarietyVista, the 1970-S RPM-009 Jefferson Nickel is a proof issue from the San Francisco Mint exhibiting an S/S Rotated Counterclockwise repunched mintmark, where the secondary S impression is displaced with a counterclockwise rotational component relative to the primary placement. Die markers UVC-534 / DMR-011 track three stages: Stage A with both obverse and reverse at EDS; Stage B at MDS (unconfirmed); and Stage C at LDS (unconfirmed). The confirmed EDS designation for Stage A indicates that early die state proof specimens have been positively identified, establishing the die pair's baseline condition. Repunched mintmarks on proof coins are particularly noteworthy because proof dies generally received more careful handling and quality control than business strike dies, making RPM varieties on proofs less common relative to the number of dies manufactured. The rotated counterclockwise displacement creates a distinctive overlap pattern where the S curves from the secondary impression appear slightly tilted relative to the primary S, producing diagnostic separation that differs from simple directional shifts. The Jefferson Nickel was designed by Felix Schlag and struck as a proof at the San Francisco Mint in 1970, composed of 75% copper and 25% nickel, weighing 5.0 grams with a diameter of 21.21 mm. Proof Jefferson Nickels from 1970 were included in the annual proof sets sold to collectors through the San Francisco Mint, with the mirror-like fields and frosted devices characteristic of the proof striking process potentially making the rotational RPM more visible than on business strikes due to the superior surface quality. The S mintmark was applied manually to each proof die before it was prepared with the polished and treated surfaces required for proof production.

Die Markers

• UVC-534
• DMR-011
• Stage A:
• Obverse and Reverse are EDS
• Stage B:
• MDS (unconfirmed)
• Stage C:
• LDS (unconfirmed)

Attribution History

• Discovered by Michael Bozovich
• Expert attribution by VarietyVista

External References