1958-D Repunched Mintmark RPM-007

Description

The 1958-D Repunched Mintmark RPM-007 shows mintmark repunching evidence from the hand-punching process used at the Philadelphia Mint to apply branch mint letters to working dies. This Lincoln cent was struck at the Denver Mint, weighing 3.11 grams with a diameter of 19.05 mm. Die markers: UVC-594 DMR-010 Stage A: Light die scratches Northwest-Southeast on Obverse – EDS Reverse is EMDS Stage B: Abrasion doubling under chin, at throat, and back of head – EMDS Die scratches Northeast-Southwest on Obverse Die clash through N of CENT – MDS     Stage C: Two long die scratches Northeast from RT of LIBERTY – EMDS Die scratch East-West through C of CENT � MDS UVC-1153 DMR-026 Stage D: Light die crack in hair – MDS Reverse die changed – EDS Stage E: Two medium die cracks in hair – LDS Small die chip outside Left wheat lines – MDS Stage F: Light die crack on forehead – VLDS Medium die chip outside Left wheat lines – LDS Stage G: Strong die crack on forehead – VLDS Small die chip on T of CENT – VLDS Stage H: Die crack on forehead extends into upper hair – VLDS Reverse is VLDS.

Die Markers

• UVC-594
• DMR-010
• Stage A:
• Light die scratches Northwest-Southeast on Obverse – EDS
• Reverse is EMDS
• Stage B:
• Abrasion doubling under chin, at throat, and back of head – EMDS
• Die scratches Northeast-Southwest on Obverse
• Die clash through N of CENT – MDS
• Stage
• C:
• Two long die scratches
• Northeast from RT of LIBERTY – EMDS
• Die scratch East-West through C of CENT � MDS
• UVC-1153
• DMR-026
• Stage
• D:
• Light die crack in hair – MDS
• Reverse die changed – EDS
• Stage
• E:
• Two medium die cracks in hair – LDS
• Small die chip outside Left wheat lines – MDS
• Stage
• F:
• Light die crack on forehead – VLDS
• Medium die chip outside Left wheat lines – LDS
• Stage
• G:
• Strong die crack on forehead – VLDS
• Small die chip on T of CENT – VLDS
• Stage
• H:
• Die crack on forehead extends into upper hair – VLDS
• Reverse is VLDS

Attribution History

• Discovered by Harry Ellis
• Expert attribution by VarietyVista

External References