View All 1926 (S) Peace Dollar

1926-S VAM-1W

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1926 (S) Dollar VAM Variety error coin
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Verified LegacyVAM Variety
Market Value
N/A
Rarity Index
N/A
Discovery Date
1926
Last Sold
N/A

Description

David Close discovered the 1926-S VAM-1W "Die Gouges Below Y" Peace dollar in 2013, documenting several shallow vertical die gouges positioned below the letter Y in LIBERTY on Anthony de Francisci's obverse design. Cataloged as 1W II1 · B2a (Die Gouges Below Y) with die classification I-2 and rarity rating R-5 (approximately 30-75 known), this variety documents a cluster of die surface defects rather than a single isolated mark — the plural "gouges" and "several" qualifier indicate multiple parallel or near-parallel incise marks in the die that produce corresponding raised lines on struck coins. San Francisco struck approximately 6.98 million Peace dollars in 1926, among the lower mintages in the series and a date that commands consistent premiums in all grades due to the relatively constrained supply. The vertical orientation of the gouges below Y in LIBERTY places them in the field between the inscription and the upper portions of Liberty's crown rays, an area where the die surface is relatively flat and where vertical marks can be distinguished from the radial ray lines that dominate the adjacent design. Die gouges of this character — shallow and occurring in multiples — often result from die finishing processes where a file or abrasive tool left parallel striation marks, or from foreign particles dragged across the die surface during preparation. The Obverse II1 pairs with a standard B2a reverse, and David Close's 2013 discovery adds to his extensive portfolio of Peace dollar VAM identifications across multiple dates and mint facilities. At R-5 rarity, confirmed specimens are genuinely scarce, numbering between 30 and 75 known. Collectors should examine the area directly below the Y of LIBERTY under 15-20x magnification with angled raking light to cast shadows along the shallow raised vertical lines, distinguishing them from random contact marks by their consistent direction and repeatable presence across different specimens from this die.

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Last updated: August 7, 2026

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