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1961-D Repunched Mintmark RPM-028

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1961 (D) Cent Repunched Mint Mark error coin
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Verified LegacyRepunched Mint Mark

Attribution

V

Verified by

VarietyVista

Market Value
N/A
Rarity Index
N/A
Discovery Date
1961
Last Sold
N/A

Description

RPM-028 on the 1961-D Lincoln Memorial Cent, cataloged by VarietyVista as UVC-804 with die marriage record DMR-041, is a D/D/D triple-punched repunched mintmark displaced to the east on the lower serif. Six die stages chronicle an eventful die life that includes die clash evidence, its subsequent removal by abrading, and extensive reverse structural failures. Stage A carries an unconfirmed Early Die State (EDS) classification. Stage B advances to Mid Die State (MDS), where a die clash is visible through the lower 1 of the date, with the reverse also at MDS. The die clash — caused when the dies struck each other without an intervening planchet — left an impression of reverse design elements on the obverse die, visible in the date area. By Stage C (LDS), the die has accumulated significant damage: a small die break on the ear, a die break under the right base, a die chip at the right upper base, die cracks on the C and E of CENT, and die cracks on columns 1, 2, 11, and 12. Stage D (LDS) reveals that the die clash has been abraded away — polished off the die surface by Mint personnel — while die scratches running northeast-southwest cross the obverse and the right base die break has grown larger. Stage E (VLDS) adds a die chip at the right eave tip. The terminal Stage F (VLDS) introduces a die chip on the left base tip. The clash-and-abrade sequence across Stages B through D, combined with the widespread columnar cracking at Stage C, makes RPM-028 one of the more diagnostically rich varieties in the 1961-D series.

Die Markers

  • UVC-804
  • DMR-041
  • Stage A:
  • EDS (unconfirmed)
  • Stage B:
  • Die clash through lower 1 of date – MDS
  • Reverse is MDS
  • Stage C:
  • Small die break on ear – LDS
  • Die break under Right base – LDS
  • Die chip at Right upper base
  • Die cracks on C and E of CENT
  • Die cracks on column # 1, 2, 11, and 12
  • Stage D:
  • Die scratches Northeast-Southwest on Obverse – LDS
  • Die clash has been abraded away
  • Larger die break under Right base – LDS
  • Stage E:
  • Obverse is VLDS
  • Die chip at Right eave tip – VLDS
  • Stage F:
  • Obverse is VLDS
  • Die chip on Left base tip – VLDS

Attribution History

  • Discovered by Unknown
  • Expert attribution by VarietyVista

External References

Additional Notes

D/D/D East, lower Serif.

Last updated: July 10, 2026